ET4000 series

Step Height and Warpage Measurement Instruments

Step Profiler

Ultra-low measuring force for precision surface profiling

    • Suitable for step height, waviness, and warpage measurements on soft materials, thin films, and other delicate surfaces.

    • High accuracy, high resolution, and outstanding stability.

    • Ultra-low measuring force enables measurement of soft materials and delicate surfaces.
      0.5–500 µN (adjustable)

  • •Ideal for R&D and quality control applications requiring low-force measurement and automated surface profiling.

  • ET4000M／ET4000A／ET4000AK

    • 680 × 580 × 660 mm

    • 200 kg

    ET4000L

    • 930 × 930 × 790 mm

    • 450 kg

    ET4300

    • 880 × 825 × 670 mm

    • 450 kg

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